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[1] A. A. Abdel-Ghaly, E. H. El-Khodary and A. A. Ismail, Maximum likelihood estimation and optimal design in step partially accelerated life tests for the Pareto distribution with type-I censoring, Proceedings of the 14th Annual Conference on Statistics and Computer Modeling in Human and Social Sciences, Faculty of Economics and Political Science, Cairo University, Egypt, 2002, pp. 16-29.
[2] A. A. Abdel-Ghaly, E. H. El-Khodary and A. A. Ismail, Estimation and optimum constant-stress partially accelerated life test plans for a Pareto distribution with type-I censoring, Proceedings of the 38th Annual Conference of Statistics, Computer Sciences and Operation Research, ISSR, Cairo University, Egypt, 2003a, pp. 49-65.
[3] A. A. Abdel-Ghaly, E. H. El-Khodary and A. A. Ismail, Estimation and optimal design in step partially accelerated life tests for the Pareto distribution using type-II censoring, Proceedings of the 15th Annual Conference on Statistics and Computer Modeling in Human and Social Sciences, Faculty of Economics and Political Science, Cairo University, Egypt, 2003b, pp. 16-29.
[4] M. M. Abdel-Ghani, Investigation of some lifetime models under partially accelerated life tests, Ph.D. Thesis, Department of Statistics, Faculty of Economics and Political Science, Cairo University, Egypt, 1998.
[5] M. M. Abdel-Ghani, The estimation problem of the log-logistic parameters in step partially accelerated life tests using type-I censored data, National Rev. Soc. Sci. 41(2) (2004), 1-19.
[6] D. S. Bai and S. W. Chung, Optimal design of partially accelerated life tests for the exponential distribution under type-I censoring, IEEE Trans. Reliab. 41(3) (1992), 400-406.
[7] D. S. Bai, S. W. Chung and Y. R. Chun, Optimal design of partially accelerated life tests for the lognormal distribution under type-I censoring, Reliab. Eng. Sys. Safety 40 (1993), 85-92.
[8] D. S. Bai, J. G. Kim and Y. R. Chun, Design of failure-censored accelerated life-test sampling plans for lognormal and Weibull distributions, Eng. Opt. 21 (1993), 197-212.
[9] G. K. Bhattacharyya and Z. Soejoeti, A tampered failure rate model for step-stress accelerated life test, Comm. Statist. Theory Methods 18(5) (1989), 1627-1643.
[10] M. H. DeGroot and P. K. Goel, Bayesian and optimal design in partially accelerated life testing, Naval Research Logistics Quarterly 16(2) (1979), 223-235.
[11] P. K. Goel, Some estimation problems in the study of tampered random variables, Technical Report No. 50, Department of Statistics, Carnegie-Mellon University, Pittsburgh, Pennsylvania, 1971.
[12] A. A. Ismail, The test design and parameter estimation of Pareto lifetime distribution under partially accelerated life tests, Ph.D. Thesis, Department of Statistics, Faculty of Economics & Political Science, Cairo University, Egypt, 2004.
[13] A. A. Ismail, On the optimal design of step-stress partially accelerated life tests for the Gompertz distribution with Type-I censoring, Al-Nahda, A Quarterly Academic Journal, 7(2), April, Faculty of Economics & Political Science, Cairo University, Egypt. Also published in InterStat, June, 1, 2006a.
[14] A. A. Ismail, Optimum constant-stress partially accelerated life test plans with type-II censoring: The case of Weibull failure distribution, InterStat, July, 6, 2006b.
[15] W. Nelson, Accelerated life testing: statistical models, Data Analysis and Test Plans, John Wiley & Sons, New York, 1990.
[16] S. A. Vander Wiel and W. Q. Meeker, Accuracy of approximate confidence bounds using censored Weibull regression data from accelerated life tests, IEEE Trans. Reliab. 39(3) (1990), 346-351.
[17] C. Xiong and M. Ji, Analysis of grouped and censored data from step-stress life test, IEEE Trans. Reliab. 53(1) (2004), 22-28. |