Cr-doped �with �polycrystalline ceramic were synthesized at high pressure by conventional solid-state reaction and their crystal structural and dielectric properties were investigated. The crystal structure of the samples at room temperature was found to be monoclinic symmetry. The high temperature X-ray diffraction pattern (HXRD) reveals a structural phase transition for the samples and the transition temperature decreases upon Cr-doping being increased. To confirm the phase transition in the samples, the dielectric was measured at different frequencies as function of temperature for the samples, it shows the existence of phase transition, and the transition temperatures shifted to lower value with Cr-doping. However, the Cr-doping increases the dielectric of �by approximately 7 orders of magnitude.