Far East Journal of Theoretical Statistics
Volume 6, Issue 1, Pages 49 - 55
(January 2002)
|
|
BAYESIAN ANALYSIS OF THE TAMPERED FAILURE RATE ACCELERATED
LIFE TEST
Mohamed T. Madi (U. A. E.)
|
Abstract: In this research work, Bayesian analysis for the simple
tampered failure rate step-stress accelerated life test using informative priors
is studied. Life distribution under constant stress is assumed to be Weibull.
Bayesian computations are performed using the Gibbs and Metropolis samplers. A
data set is used to illustrate the analysis. |
Keywords and phrases: step-stress, Weibull
distribution, life testing, Gibbs and Metropolis samplers. |
|
Number of Downloads: 3 | Number of Views: 803 |
|